Application Note:
Multislice Implementation for Inclined Illumination and Convergent-Beam Electron Diffraction (International Symposium on Hybrid Analyses For Functional Nanostructure, Kyoto, 1998)
New electron diffraction method to identify the chirality of enantiomorphic crystals (Acta Cryst. (2003) B59)

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CBED
for MacHREMTM/ WinHREMTM

Coherent Convergent Beam Electron Diffraction
Pattern Simulation Program


Simulated CBED pattern for Si [111]


This optional function adds the capability for simulating coherent convergent beam electron diffraction (CBED) patterns to the MacHREMTM /WinHREMTM program suite.
  • User Friendly Graphical Interface
  • Even a novice user can easily generate his/her data and perform computation.
  • Reliable and Efficient Algorithm
  • Dynamical electron interaction is efficiently estimated by using the FFT multislice technique.
  • High Quality Image Output
  • All images are generated with a standard image format of Windows/Mac OS. Therefore, high quality images can be printed from them, and they can be imported into another application.


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HREM Research Inc.

14-48 Matsukazedai, Higashimatsuyama, 355-0055 JAPAN
TEL/FAX 0493-35-3919
email: support@hremresearch.com