Application Note: FFT MULTISLICE APPROACH FOR STEM IMAGE SIMULATION (ICEM15, Durban, 2002)

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STEM for MacHREMTM/ WinHREMTM Scanning Transmission Electron Microscope Image Simulation Program Simulated HAADF image for GaAs [011] This optional function adds the capability for simulating high-resolution scanning transmission electron microscope images to the MacHREMTM/WinHREMTM program suite. Using this program you can simulate bright-field images, dark-field images and high-angle annular dark-field (HAADF) images by using the FFT multislice technique on a personal computer. User Friendly Graphical Interface Even a novice user can easily generate his/her data and perform computation. Reliable and Efficient Algorithm Dynamical electron interaction is efficiently estimated by using the FFT multislice technique. High Quality Image Output All images are generated with a standard image format of Windows/Mac OS. Therefore, high quality images can be printed from them, and they can be imported into another application. Please Contact to: HREM Research Inc. 14-48 Matsukazedai, Higashimatsuyama, 355-0055 JAPAN TEL/FAX 0493-35-3919 email: support@hremresearch.com Reference: K. Ishizuka: A practical approach for STEM image simulation based on the FFT multislice method, Ultramicroscopy 90 (2001) 71-83