FTSR for DigitalMicrograph
The Focal and Tilt Series Reconstruction (FTSR) method works with a focal series of HREM images to reconstruct a wave function. This method also works with a tilt series in order to improve resolution, theoretically doubleing the resolution of a normal illimination focal series. Using the FTSR you can obtain the wave function at the specimen exit surface that is not affected by spherical aberration. Therefore, the FTSR is a software Cs-corrector.
References and Technical Notes
Examples (Sample Data)
R. R. Meyer, A. I. Kirkland and W. O. Saxton: A new method for the determination of the wave aberration function for high resolution TEM: 1. Measurement of the symmetric aberrations; Ultramicroscopy, 92 (2002) 89-109; and
R. R. Meyer , A. I. Kirkland and W. O. Saxton: A new method for the determination of the wave aberration function for high-resolution TEM.: 2. Measurement of the antisymmetric aberrations; Ultramicroscopy, 99 (2004) 115-123.
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