GPA generates fully quantitative deformation and two-dimensionalstrain maps from standard high-resolution (S)TEM images.
GPA is based on geometric phase analysis originally developed by Martin Hytch.
GPA is a complementary plug-in to Peak Pairs Analysis (see PPA plug-in), which is another strain measurement plug-in bead on the atomic-column positions in HR-(S)TEM images.
Using the GPA technique, we have developed two alternative plug-ins that can be applicable to a wider field of view with higher accuracy: one is based on STEM Moire technique (see sMoire plug-in), and the other uses dark-field Holography (see HoloDark plug-in).
| Flier/Specifications Manual |
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- M.J. Hytch, E. Snoeck and R. Kilaas, Ultramicroscopy 74 (1998) 131-146. Quantitative measurement of displacement and strain fields from HREM micrographs
- C. L. Johnson, M. J. Hytch, P. R. Buseck, PNAS 101 (2004) 17936-17939. Nanoscale waviness of low-angle grain boundaries
- M. J. Hytch, J-L. Putaux, J-M. Penisson, Nature 423 (2003) 270-273. Measurement of the displacement field around dislocations to 0.03A by electron microscopy
You have to purchase a license (hardware key) to run this program.
Please send your price enquiry to support@hremresearch.com.
- GPA Phase v4.12
for GMS 3.4 (64bit)
for GMS 3.3 (64bit) (applicable from GMS 3.0)
for GMS 2.3 32bit GMS 2.3 64bit
for GMS 2.1 32bit GMS 2.1 64bit (applicable from GMS 2.0)
- IPU plug-in (Free Software)
- HREM Mouse plug-in (Free Software)
- User Key Driver / Remote Update System (RUS)
- GPA Phase v4.11.2
for GMS 3.4 (64bit)
for GMS 3.3 (64bit) (applicable from GMS 3.0)
for GMS 2.3 32bit GMS 2.3 64bit
for GMS 2.1 32bit GMS 2.1 64bit (applicable from GMS 2.0)
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Please send your questions and inquiries to
support@hremresearch.com