QED (Quantitative Electron Diffraction) controls the electron beam in your TEM
to acquire LARBED (Large Angle Rocking Beam Electron Diffraction) and/or PED
(Precession Electron Diffraction) patterns.
QED accurately determines specimen thickness, absolute values of structure factors,
and specimen surface orientation from LARBED data.
QED is based on the patented technique and routines developed by Christoph Koch.
| Flier/Specifications Manual |
|
-
C. T. Koch: Ultramicroscopy, 111 (2011) 828-840
Aberration-compensated large-angle rocking beam electron diffraction -
C. T. Koch: US patent, US 2011/0049363 A1 (2011)
Method and Device for Measureing Electron Diffraction of a Sample -
R. Vincent , P. A. Midgley: Ultramicroscopy, 53 (1994) 271-282
Double conical beam-rocking system for measurement of integrated electron diffraction intensities -
C. T. Koch: arXiv:0810.3811v1 (2008)
Many-Beam Solution to the Phase Problem in Crystallography
- LARBED data stack (517 MB)
(data name: Stack_disc_L=290mm_18pts.dm3)
- CBED data stack (364 MB)
(data name: CLARBED_15pts_bin4_merged.dm3)
Original data stacks 0 (263 MB) (data name: CLARBED_15pts_bin4_0.dm3)
Original data stacks 1 (110 MB) (data name: CLARBED_15pts_bin4_1.dm3)
You have to purchase a license (hardware key) to run this program.
Please send your price enquiry to support@hremresearch.com.
- QED/Acquisition v1.5.7
for GMS 3.4 (64bit)
for GMS 3.3 (64bit) (applicable from GMS 3.0)
for GMS 2.3 32bit GMS 2.3 64bit
for GMS 2.1 32bit GMS 2.1 64bit (applicable from GMS 2.0)
for GMS 1.x (32bit)
- IPU plug-in (Free Software)
- User Key Driver / Remote Update System (RUS)
- QED/Acquisition v1.5.6
for GMS 3.3 (64bit) (applicable from GMS 3.0)
for GMS 2.3 32bit GMS 2.3 64bit
for GMS 2.1 32bit GMS 2.1 64bit (applicable from GMS 2.0)
for GMS 1.x (32bit)
Please Subscribe to the HREM News to get latest information on this plugin.
Note: If you have already subscribed to the HREM News, please don't subscribe again.
Please send your questions and inquiries to
support@hremresearch.com